Description
Tag, HF, EEPROM, memory 128 byte, The high-temperature tags must undergo adequate stress tests within the proposed temperature processes before deployment., The following stress test was performed on this tag:Cyclic temperature stress: 20 min. at 20 °C 20 min. at 220 °C.Number of tested cycles: 1500This successfully performed test does not imply suitability for a specific high-temperature application, but merely serves as proof of the basic usability., The TH-Q51S-HT and TH-Q51T-HT brackets protect the tag from mechanical loads and allow the mounting on metal.
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